Gaya APA
SPIED, I. (2019).
Proceedungs of SPIE: Optical Technology and Measurement for Industrial Applications Conference .
Tokyo:
SPIED.
Gaya MLA
SPIED, Internasional..
"Proceedungs of SPIE: Optical Technology and Measurement for Industrial Applications Conference".
Tokyo:
SPIED,
2019.
Proceding.